Hall measurement system is used in this lab to determine material parameters such as carrier mobility, carrier concentration (n), Hall coefficient (RH), resistivity and the conductivity type (N or P).
IV Characteristics Device
In this lab the semiconductor parameter analyzer, Keithley 4200 SCS is used to measure the electrical properties of semiconductor devices.
CV Measurement Device
The CV Measurement device in this lab uses the capacitance–voltage profiling technique for characterizing semiconductor layered structures.
